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Influence of the density of states of graphene on the transport properties of graphene/MoS2/metal vertical field-effect transistors

机译:石墨烯状态密度对运输的影响   石墨烯/ mos2 /金属垂直场效应晶体管的特性

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摘要

We performed detailed studies of the current-voltage characteristics ingraphene/MoS2/metal vertical field-effect transistors. Owing to its low densityof states, the Fermi level in graphene is very sensitive to its carrier densityand thus the external electric field. Under the application of a bias voltageVB between graphene and the metal layer in the graphene/MoS2/metalheterostructure for driving current through the van der Waals interface, theelectric field across the MoS2 dielectric induces a shift in the Fermi level ofgraphene. When the Fermi level of graphene coincides with the Dirac point, asignificant nonlinearity appears in the measured I-V curve, thus enabling us toperform spectroscopy of the Dirac point. By detecting the Dirac point fordifferent back-gate voltages, we revealed that the capacitance of thenanometer-thick MoS2 layer can be determined from a simple DC transportmeasurement.
机译:我们对石墨烯/ MoS2 /金属垂直场效应晶体管的电流-电压特性进行了详细研究。由于其状态密度低,石墨烯中的费米能级对其载流子密度和外部电场非常敏感。在石墨烯和石墨烯/ MoS2 /金属异质结构中的金属层之间施加偏置电压VB以驱动电流通过范德华斯界面时,跨过MoS2电介质的电场会引起石墨烯费米能级的移动。当石墨烯的费米能级与Dirac点重合时,在测得的I-V曲线中会出现明显的非线性,从而使我们能够执行Dirac点的光谱分析。通过检测不同背栅电压的狄拉克点,我们发现可以通过简单的直流传输测量来确定纳米厚度的MoS2层的电容。

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